Research

Facility

Our laboratory is located in room 609 of the McConnell Engineering Building on the McGill University Campus. We have a variety of semiconductor device characterization equipment.

Variable Temperature Probe Station

Low temp probe station

Janis ST-500, variable sample temperature down to LHe temperatures.

Low temp probe station

With a graphene sample.

Glove box

Micromanipulator

Glove box with optical microscope and spin-coater.

Hall Measurement System

Closed loop magnetic field control up to 2.3 T, and lock-in amplifier for Hall measurements.

GMW 5403 with 20A bipolar current supply.

GMW 5403 with 20A bipolar current supply.

Electronic Instrumentation

A variety of amplifiers, low-noise sources, oscilloscopes, and a semiconductor parameter analyzer – the things you need for characterizing solid state devices.

Agilent B1500.

Agilent B1500.

He3 Cryostat + 8T Superconducting solenoid

IceOxford Lemon.

IceOxford Lemon.

He3 Cryostat

Oxford Heliox AC-V.

Oxford Heliox AC-V.

He4 Cryostats

Janis CCS-150, 10K closed loop optical cryostat.

Janis CCS-150, 10K closed loop optical cryostat.

Janis 8CNDT, 1.2K base temperature, open loop.

Janis 8CNDT, 1.2K base temperature, open loop.

Optics

Nikon Optiphot, 60X obj., BF+DF.

Nikon Optiphot, 60X obj., BF+DF.

Miscellaneous

test.

Vintage Leybold-Heraeus helium leak detector.

test.

Mechano-thermal reactor for methylxanthine alkaloid extraction.